| 产品图片 | 产品型号 | 制造商 | 封装 | 现有库存 | 参考价格 | 产品简介 | PDF | 
                        
                                
                                    |   | SN74ABT8543DWG4 | Texas Instruments | 28-SOIC | 8,020 - 厂方库存 | 75.758 | IC SCAN TEST DEVICE 28SOIC |   | 
                                    |   | SN74ABT8952DWE4 | Texas Instruments | 28-SOIC | 4,520 - 厂方库存 | 75.758 | IC SCAN TESST DEVICE 28-SOIC |   | 
                                    |   | SN74ABT8652DWE4 | Texas Instruments | 28-SOIC | 1,200 - 厂方库存 | 75.758 | IC SCAN TEST DEVICE 28-SOIC |   | 
                                    |   | SN74ABT8543DWE4 | Texas Instruments | 28-SOIC | 8,020 - 厂方库存 | 75.758 | IC SCAN TEST DEVICE 28-SOIC |   | 
                                    |   | SN74ABTE16245DLG4 | Texas Instruments | 48-SSOP | 1,925 - 厂方库存 | 75.110 | IC 16BIT I-WS BUS TXRX 48-SSOP |   | 
                                    |   | SN74ABT18245ADLG4 | Texas Instruments | 56-SSOP | 5,600 - 厂方库存 | 72.520 | IC SCAN TEST DEVICE 18BIT 56SSOP |   | 
                                    |   | SN74BCT8373ANTE4 | Texas Instruments | 24-PDIP | 780 - 厂方库存 | 70.315 | IC SCAN TEST DEVICE LATCH 24-DIP |   | 
                                    |   | SN74BCT8244ANTE4 | Texas Instruments | 24-PDIP | 900 - 厂方库存 | 70.315 | IC SCAN TEST DEVICE BUFF 24-DIP |   | 
                                    |   | SN74FB2033ARCRG3 | Texas Instruments | 52-QFP(10x10) | 500 - 厂方库存 | 69.629 | IC REGISTERED TXRX 8BIT 52QFP |   | 
                                    |   | SN74ABT8646DLG4 | Texas Instruments | 28-SSOP | 800 - 厂方库存 | 69.598 | IC SCAN TEST DEVICE 28-SSOP |   | 
                                    |   | SN74BCT8245ADWG4 | Texas Instruments | 24-SOIC | 3,350 - 厂方库存 | 67.340 | IC SCAN TEST DEVICE 24SOIC |   | 
                                    |   | SN74BCT8245ADWE4 | Texas Instruments | 24-SOIC | 3,350 - 厂方库存 | 67.340 | IC SCAN TEST DEVICE TXRX 24-SOIC |   | 
                                    |   | SN74BCT8245ADW | Texas Instruments | 24-SOIC | 3,350 - 厂方库存 | 67.340 | IC SCAN TEST DEVICE TXRX 24-SOIC |   | 
                                    |   | SN74ABT8996PW | Texas Instruments | 24-TSSOP | 4,440 - 厂方库存 | 64.750 | IC ADDRESSABLE SCAN PORT 24TSSOP |   | 
                                    |   | SN74BCT8374ADWG4 | Texas Instruments | 24-SOIC | 2,075 - 厂方库存 | 62.423 | IC SCAN TEST DEVICE 24SOIC |   | 
                                    |   | SN74BCT8374ADWE4 | Texas Instruments | 24-SOIC | 2,075 - 厂方库存 | 62.423 | IC SCAN TEST DEVICE W/FF 24-SOIC |   | 
                                    |   | SN74BCT8373ADWG4 | Texas Instruments | 24-SOIC | 775 - 厂方库存 | 62.422 | IC SCAN TEST DEVICE 24SOIC |   | 
                                    |   | SN74BCT8240ADWG4 | Texas Instruments | 24-SOIC | 200 - 厂方库存 | 62.422 | IC SCAN TEST DEVICE 24SOIC |   | 
                                    |   | SN74BCT8373ADWE4 | Texas Instruments | 24-SOIC | 775 - 厂方库存 | 62.422 | IC SCAN TEST DEVICE LATCH 24SOIC |   | 
                                    |   | SN74BCT8373ADW | Texas Instruments | 24-SOIC | 775 - 厂方库存 | 62.422 | IC SCAN TEST DEVICE LATCH 24SOIC |   |