|
序号
|
元器件名称
|
元器件制造商
|
元器件说明
|
PDF资料下载
|
产品购买
|
|
1
|
SN74LVTH182646APM
|
Texas Instruments
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
|
产品购买
|
|
2
|
SN74ABT18504PMG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 20BIT 64LQFP
|
|
产品购买
|
|
3
|
SN74ABTE16246DLG4
|
Texas Instruments
|
IC 11BIT I-WS BUS TXRX 48-SSOP
|
|
产品购买
|
|
4
|
SN74ABT8952DLG4
|
Texas Instruments
|
IC SCAN TESST DEVICE 28-SSOP
|
|
产品购买
|
|
5
|
SN74ABT8652DLG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 28-SSOP
|
|
产品购买
|
|
6
|
SN74ABT8543DLG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 28-SSOP
|
|
产品购买
|
|
7
|
SN74ABT18640DLG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 18BIT 56SSOP
|
|
产品购买
|
|
8
|
SN74ABT8952DWG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 28SOIC
|
|
产品购买
|
|
9
|
SN74ABT8652DWG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 28SOIC
|
|
产品购买
|
|
10
|
SN74ABT8543DWG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 28SOIC
|
|
产品购买
|
|
11
|
SN74ABT8952DWE4
|
Texas Instruments
|
IC SCAN TESST DEVICE 28-SOIC
|
|
产品购买
|
|
12
|
SN74ABT8652DWE4
|
Texas Instruments
|
IC SCAN TEST DEVICE 28-SOIC
|
|
产品购买
|
|
13
|
SN74ABT8543DWE4
|
Texas Instruments
|
IC SCAN TEST DEVICE 28-SOIC
|
|
产品购买
|
|
14
|
SN74ABTE16245DLG4
|
Texas Instruments
|
IC 16BIT I-WS BUS TXRX 48-SSOP
|
|
产品购买
|
|
15
|
SN74ABT18245ADLG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 18BIT 56SSOP
|
|
产品购买
|
|
16
|
SN74BCT8373ANTE4
|
Texas Instruments
|
IC SCAN TEST DEVICE LATCH 24-DIP
|
|
产品购买
|
|
17
|
SN74BCT8244ANTE4
|
Texas Instruments
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
|
产品购买
|
|
18
|
SN74FB2033ARCRG3
|
Texas Instruments
|
IC REGISTERED TXRX 8BIT 52QFP
|
|
产品购买
|
|
19
|
SN74ABT8646DLG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 28-SSOP
|
|
产品购买
|
|
20
|
SN74BCT8245ADWG4
|
Texas Instruments
|
IC SCAN TEST DEVICE 24SOIC
|
|
产品购买
|